The hydrodynamic conditions and the substrate load in biofilm systems are two main parameters which influence the biofilm growth in particular the structure, density and thickness. In a long term study on heterotrophic biofilms in biofilm tube reactors the investigation has focussed on mass transfer at the bulk/biofilm interface, the biofilm density and the substrate conversion rates. To study the mass transfer phenomena at the bulk/biofilm interface oxygen profiles have been measured directly in tube reactors with microelectrodes. Microelectrode studies, substrate conversion rates and biofilm densities were used to formulate model equations for the simulation of biofilm growth under different hydrodynamic and substrate conditions. It can be shown that the mass transfer at any time is strongly coupled with the growth conditions during the biofilm cultivation. On the one side the calculated Sherwood numbers were coupled to the present hydraulic conditions, on the other side in addition the growth conditions such as growth rate and Reynolds number during biofilm cultivation were considered.
Skip Nav Destination
Article navigation
Research Article|
July 01 2002
Simulation of biofilm growth, substrate conversion and mass transfer under different hydrodynamic conditions
H. Horn;
H. Horn
**FH Magdeburg, Hydrochemistry, Breitscheidstr. 2, 39114 Magdeburg, Germany (E-mail: [email protected])
Search for other works by this author on:
S. Wäsche;
*TU Braunschweig, Institute of Biochemical Engineering, Gaußstr. 17, 38100 Braunschweig, Germany (E-mail: [email protected])
E-mail: [email protected]
Search for other works by this author on:
D.C. Hempel
D.C. Hempel
*TU Braunschweig, Institute of Biochemical Engineering, Gaußstr. 17, 38100 Braunschweig, Germany (E-mail: [email protected])
Search for other works by this author on:
Water Sci Technol (2002) 46 (1-2): 249–252.
Citation
H. Horn, S. Wäsche, D.C. Hempel; Simulation of biofilm growth, substrate conversion and mass transfer under different hydrodynamic conditions. Water Sci Technol 1 July 2002; 46 (1-2): 249–252. doi: https://doi.org/10.2166/wst.2002.0484
Download citation file:
Sign in
Don't already have an account? Register
Client Account
You could not be signed in. Please check your email address / username and password and try again.
Could not validate captcha. Please try again.
eBook
Pay-Per-View Access
$38.00